Built-in self-test algorithm for row/column pattern sensitive faults in RAM's
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Date
1990Author
Franklin, Manoj
Saluja, Kewal K.
Kinoshita, Kozo
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Citation
Franklin, M., Saluja, K. K., & Kinoshita, K. (1990). Built In Self Test Algorithm For Row/Column Pattern Sensitive Faults In Ram'S. Ieee Journal Of Solid State Circuits, 25(2), 514-524.