Improved test generation for high-activity circuits
Permanent Link
http://digital.library.wisc.edu/1793/10328Description
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Citation
Saluja, K., & Kim, K. (1990). Improved Test Generation For High Activity Circuits. Ieee Design & Test Of Computers, 7(4), 26-31.