Statistical estimation and testing for variation root-cause identification of multistage manufacturing processes
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Date
2004Author
Zhou, Shiyu
Chen, Yong
Shi, Jianjun
Publisher
Institute of Electrical and Electronics Engineers Inc., Piscataway, United States
Metadata
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http://digital.library.wisc.edu/1793/8826Description
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Citation
Zhou, S., Chen, Y., & Shi, J. (2004). Statistical Estimation And Testing For Variation Root Cause Identification Of Multistage Manufacturing Processes. Ieee Transactions On Automation Science And Engineering, 1(1), 73-83.