Structural disorder induced in hydrogenated amorphous silicon by light soaking
File(s)
Date
1998Author
Gibson, J. M.
Treacy, M. M. J.
Voyles, P. M.
Jin, H-C.
Abelson, J. R.
Metadata
Show full item recordAbstract
We show, using variable coherence transmission electron microscopy, that light soaking of amorphous hydrogenated silicon thin films leads to structural changes. We speculate that the structural changes are associated with instability in the as-deposited material. We suggest that improved immunity to Staebler?Wronski degradation could be achieved by a less-ordered material which is closer to the ideal continuous random network.
Subject
amorphous silicon
medium range order
fluctuation electron microscopy
Permanent Link
http://digital.library.wisc.edu/1793/63392Description
http://dx.doi.org/10.1063/1.122683
Citation
Applied Physics Letters 73, 3093 (1998)