Evaluation of diffusion-driven material property profiles using three-wavelength interdigital sensor
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Date
2001Author
Mamishev, Alexander V.
Du, Yanqing
Bau, Jason H.
Lesieutre, Bernard C.
Zahn, Markus
Publisher
IEEE
Metadata
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http://digital.library.wisc.edu/1793/10270Description
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Citation
Mamishev, A.V., Du, Y., Bau, J.H., Lesieutre, B.C., & Zahn, M. (2001). Evaluation Of Diffusion Driven Material Property Profiles Using Three Wavelength Interdigital Sensor. Ieee Transactions On Dielectrics And Electrical Insulation, 8(), 785-98.